Solar >> Logomatic GmbH

Ingot Lifetime scanning

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Detailed Specs

– Mapping of carrier lifetime, photoconductivity, resistivity
– Non-contact, non-destructive electrical semiconductor characterisation
– Two dimensional ingot mapping system for solar grade multi silicon
– Measurement time: 2 minutes for two surfaces simultaneously
– One ingot four sides with handling: 5 – 6 min
– Resolution 1 mm